X-ray technique, Spark Emission OES, Raman Spectrometer - RGS Corporation Sdn Bhd

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X-Ray - Material Analysis

 

MiniFlex™


MiniFlexTM
The 5th generation MiniFlex is a general purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials. The MiniFlex is available in two variations. Operating at 600 watts (X-ray tube), the MiniFlex 600 is twice as powerful as other benchtop models, enabling faster analysis and improved overall throughput. Running at 300 watts (X-ray tube), the new MiniFlex 300 does not require an external heat exchanger. Each model is engineered to maximize flexibility in a benchtop package.

Ideally-suited for today's fast-paced XRD analyses, the new 5th generation MiniFlex delivers speed and sensitivity through innovative technology enhancements such as the optional D/teX high speed detector coupled with the new 600W X-ray source. The optional graphite monochromator, coupled with the standard scintillation counter, maximizes sensitivity by optimizing peak-to-background ratios. If resolution is paramount, incident and diffracted beam slits can be selected to provide the desired resolution. For high sample throughput, MiniFlex is the only benchtop XRD system with an available sample changer. Whether teaching X-ray diffraction at the college and university level, or routine industrial quality assurance, the MiniFlex delivers both performance and value.

Each MiniFlex comes standard with the latest version of PDXL, Rigaku's full-function powder diffraction analysis package. The latest version of PDXL offers important new functionality; including a fundamental parameter method (FP) for more accurate peak calculation, phase identification using the Crystallography Open Database (COD), and a wizard for ab inito crystal structure analysis.

The original MiniFlex, introduced in 1973, was designed to empower a novice user to produce results, with a compact XRD instrument, comparable to those obtainable by a trained diffractionist. The new MiniFlex builds upon the characteristics which have made it popular for many years – including compact size and robust design – enabling installation in a small space with easy-to-use operation and very low cost-of-ownership.

Overview:

  • New 5th generation design for 2012
  • Compact, fail-safe radiation enclosure
  • Incident beam variable slit
  • Simple installation and user training
  • Factory aligned goniometer system
  • Laptop computer operation
Measurements:
  • Phase identification
  • Phase quantification
  • Percent (%) crystallinity
  • Crystallite size and strain
  • Lattice parameter refinement
  • Rietveld refinement
  • Molecular structure
Options:
  • 6-position autosampler
  • Graphite monochromator
  • High speed silicon strip detector
  • Air sensitive sample holder
  • Travel case

 

 

 

X-ray technique, Spark Emission OES, Raman Spectrometer - RGS Corporation Sdn Bhd
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