X-ray technique, Spark Emission OES, Raman Spectrometer - RGS Corporation Sdn Bhd

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X-Ray - Elemental Analysis

 

NEX CG II




Next-generation Advanced Cartesian Geometry EDXRF 
for Rapid Qualitative and Quantitative Elemental Analysis

NEX CG II, a powerful second-generation energy dispersive X-ray fluorescence (EDXRF) spectrometer, delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films. 

  • Non-destructive elemental analysis for sodium (Na) to uranium (U)

  • Quick elemental analyses of solids, liquids, powders, coatings, and thin films

  • Indirect excitation for exceptionally low detection limits

  • High-power 50 kV 50 W X-ray tube

  • Large-area high-throughput silicon drift detector (SDD)

  • Analysis in air, helium, or vacuum

  • Powerful and easy to use QuantEZ® software with multilingual user interface

  • Advanced RPF-SQX Fundamentals Parameters software featuring Scattering FP

  • Rigaku Profile Fitting (RPF) advanced algorithm for peak deconvolution

  • Various automatic sample changers accommodating up to 52 mm samples

  • Low cost of ownership backed by a 2-year warranty

 

 

 

X-ray technique, Spark Emission OES, Raman Spectrometer - RGS Corporation Sdn Bhd
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