Qualitative and quantitative phase analysis of poly-crystalline materials
Benchtop X-ray diffractometer for phase analysis
New sixth generation MiniFlex benchtop X-ray diffractometer is a multipurpose powder diffraction analytical instrument that can determine: crystalline phase identification (phase ID) and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to the MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex XRD system decades ago.
X-ray powder diffraction with HPAD detector
MiniFlex XRD system delivers speed and sensitivity through innovative technology advances, including the HyPix-400 MF 2D hybrid pixel array detector (HPAD) together with an available 600 W X-ray source and new 8-position automatic sample changer.
Features
New 6th generation design
Compact, fail-safe radiation enclosure
Incident beam variable slit
Simple installation and user training
Factory aligned goniometer system
Laptop computer operation
Measurements:
Phase identification
Phase quantification (phase ID)
Percent (%) crystallinity
Crystallite size and strain
Lattice parameter refinement
Rietveld refinement
Molecular structure
Options:
8-position autosampler
Graphite monochromator
D/teX Ultra: silicon strip detector
HyPix-400 MF: 2D HPAD detector
Air sensitive sample holder
Travel case
X-ray technique, Spark Emission OES, Raman Spectrometer - RGS Corporation Sdn Bhd
